Abstract
Cd1-x Mn x Te thin films were prepared by co-sputtering CdTe and Mn targets on to a variety of substrates at room temperature. The sputter powers of the CdTe and the Mn targets were fixed at 75 W and 65 W, respectively, and the influences of the substrate on the structural properties of the deposited thin films were investigated. All of the films were polycrystalline in nature, and X-ray diffraction showed that the lattice constant varied between 6.3912 and 6.4518 Ǻ depending on the substrate. The incorporated Mn mole fraction varied between 12.796% and 13.046%; this variation may be attributed to a change in the band-gap. The band-gap energy increased from 1.6767 to 1.6799 eV and the grain size decreased from 133 to 74 nm as the strain increased from 14.12% to 34.12% for the various substrates.
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References
N. Booth and A. S. Smith, Infrared Detectors (Goodwin House Publishers, New York & Boston, 241, 1997).
A. Burger, K. Chattopadhyay, H. Chen, J. O. Ndap, X. Ma, S. Trivedi, S. W. Kutcher, R. Chen and R. D. Resemeier, J. Cryst. Growth 198, 872 (1999).
A. Owens and A. Peacock, Nucl. Instr. Meth. Phys. Res. 531, 18 (2004).
A. Tanaka, Y. Masa, S. Seto and T. Kawasaki, J. Cryst. Growth 94, 166 (1989).
S. R. Cullity and Stock, Elements of X-ray Diffraction 3rd (Prentice Hall, Berkeley 2001).
D. R. Yoder-short, U. Debska and J. K. Furdyna, J. Appl. Phys. 58, 4056 (1985).
W. Giriat, J. K. Furdyna and J. Kossut (Eds), Diluted Magnetic Semiconductors, Semiconductors and Seminetals, 25 (Academic, Boston, 1988), Chap. 1.
R. W. G. Wyckoff, Crystal Structures (Interscience Publishs, New York, 1963).
N. Bottka, J. Stankiewuez and W. Giriat, J. Appl. Phys, 52, 41 (1981).
M. El Amrani, J. P. Lascaray and J. Diouri, Solid State Commun. 45, 351 (1983).
K. H. Kim, A. E. Bolotmikov, G. S. Camarda, G. Yang, A. Hossain, Y. Cui, R. B. James, J. Hong and S. U. Kim, J. Appl. Phys. 106, 023706 (2009).
L. E. Alexander and H. P. Klug, J. Appl. Phys. 21, 137 (1950).
C. V. Ramana, R. J. Smith and O. M. Hussain, Phys. Stat. Sol. (a) 199, R4 (2003).
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Ahn, H., Seo, J., Shin, H. et al. Substrate effects on the structural properties of Cd1-x Mn x Te thin films grown via magnetron Co-sputtering. Journal of the Korean Physical Society 67, 668–671 (2015). https://doi.org/10.3938/jkps.67.668
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DOI: https://doi.org/10.3938/jkps.67.668