Abstract
A modification of the Z-scan technique for measuring nonlinear refractive index n2 in the terahertz spectral region is proposed. Measurements are made at a broadband terahertz radiation intensity of 0.8 × 109 W cm−2. Coefficient n2 = 2.5 × 10−11 cm2 W−1 is estimated for semiconductor crystalline ZnSe.
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ACKNOWLEDGMENTS
This work was supported by leading universities of the Russian Federation, subsidy 08-08; and by the Government of the Russian Federation, project 3.9041.2017/7.8.
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Translated by L. Mosina
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Tcypkin, A.N., Putilin, S.E., Kulya, M.C. et al. Experimental Estimate of the Nonlinear Refractive Index of Crystalline ZnSe in the Terahertz Spectral Range. Bull. Russ. Acad. Sci. Phys. 82, 1547–1549 (2018). https://doi.org/10.3103/S1062873818120237
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DOI: https://doi.org/10.3103/S1062873818120237