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Investigation of the e0-electron yield from the surface of thin films under bombardment by α and β particles from radioactive sources

  • Proceedings of the LVI International Conference “Nucleus-2006”
  • Published:
Bulletin of the Russian Academy of Sciences: Physics Aims and scope

Abstract

The yields of near-zero (e0) electrons from the surface of targets with different Z under their bombardment by α particles from 226Ra decay were measured by the method of eα coincidences. The ratios of the e0-electron yields for α particles with different energies E α are described well by the dependence Y e (E α) ∼ υ −1α , where υ α is the α-particle velocity. The e0-electron yield from the surface of thin films under their bombardment by β particles from radioactive sources with 152Eu, 154Eu, and 226Ra has been investigated by the method of eγ coincidences. It is established that ionization rate of target atoms in this case is inversely proportional to the velocity of incident β particles (υ −1β ), i.e., is proportional to the time of atomic electron perturbation induced by a β particle passing near an atom.

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Authors and Affiliations

  1. Institute for Nuclear Research, National Academy of Science of Ukraine, pr. Nauki 47, Kiev, 03680, Ukraine

    A. I. Feoktistov, A. A. Val’chuk, V. T. Kupryashkin, L. P. Sidorenko & I. P. Shapovalova

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  1. A. I. Feoktistov
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  2. A. A. Val’chuk
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  3. V. T. Kupryashkin
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  4. L. P. Sidorenko
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  5. I. P. Shapovalova
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Additional information

Original Russian Text © A.I. Feoktistov, A.A. Val’chuk, V.T. Kupryashkin, L.P. Sidorenko, I.P. Shapovalova, 2008, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2008, Vol. 72, No. 2, pp. 282–284.

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Feoktistov, A.I., Val’chuk, A.A., Kupryashkin, V.T. et al. Investigation of the e0-electron yield from the surface of thin films under bombardment by α and β particles from radioactive sources. Bull. Russ. Acad. Sci. Phys. 72, 262–265 (2008). https://doi.org/10.3103/S1062873808020329

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  • DOI: https://doi.org/10.3103/S1062873808020329

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