The heating rate effect on texture evolution of a 1.09 wt.% Si non-oriented electrical steel was studied by using two heating rates, 0.5°C/s (slow heating) and 15°C/s (fast heating), in the final annealing. The comparison of textures was made on similar microstructural basis, i.e., recrystallized fraction in the recrystallization stage and grain size in the grain growth stage. Change of heating rate caused little influence on the texture evolution in the recrystallization stage, implying that the texture at complete recrystallization is mainly determined by the cold-rolling structure. In the growth stage, the heating rate caused little influence on the evolution of {111}<110>, {111}<112>, and Cube components, however, made significant influence on the evolution of Goss component. For both heating rates, the intensity of Goss component increased continuously during recrystallization, but decreased rapidly as the grains grew. Comparing to the fast heating, the slow heating caused more drastic decrease in Goss component as the grains grew. Microstructure observations indicated that the average size of Goss grains was similar to that of the average recrystallized grains in the recrystallization stage, but became smaller than that of the average grains in the growth stage. It was attributed to an orientation pinning effect due to the preferential nucleation of Goss grains at shear bands. Rapid heating could make the Goss grains more dispersed in the recrystallized structure, which reduced the probability of orientation pinning encountered by these Goss grains, and delayed the decrease of growth rate of Goss grains in grain growth.