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Total-Electron-Yield Measurements by Soft X-Ray Irradiation of Insulating Organic Films on Conductive Substrates

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Abstract

The photocurrent (sample current) of insulating 0.7-µm thick polyethylene terephthalate (PET) films on conductive substrates (C, Au, Cu) was clearly measured through the substrates during soft X-ray irradiation on the PET films. X-ray absorption measurements of the PET/conductive-substrates using the total-electron-yield (TEY) method by measuring sample current easily provide the X-ray absorption spectra (XAS) of PET films, which are independent of the substrates. From additional X-ray absorption measurements using self-standing PET/Au and Au/PET-films, I-V measurements, and thickness-dependent sample current measurements, it can be confirmed that electrically conductive paths form in the insulating PET film in thickness direction along the soft X-ray beam trajectory. Such phenomena enable easy and simple TEY-XAS measurements of insulating µm-order-thick samples.

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Authors and Affiliations

  1. Graduate School of Engineering, University of Hyogo, 2167 Shosha, Himeji, Hyogo, 671-2201, Japan

    Yasuji Muramatsu

  2. Center for X-Ray Optics, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA, 94720, USA

    Eric M. Gullikson

Authors
  1. Yasuji Muramatsu
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  2. Eric M. Gullikson
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Correspondence to Yasuji Muramatsu.

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Muramatsu, Y., Gullikson, E.M. Total-Electron-Yield Measurements by Soft X-Ray Irradiation of Insulating Organic Films on Conductive Substrates. ANAL. SCI. 36, 1507–1511 (2020). https://doi.org/10.2116/analsci.20P171

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  • DOI: https://doi.org/10.2116/analsci.20P171

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