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https://doi.org/10.18429/JACoW-IPAC2021-TUPAB057
Title Carbon Beam at I-3 Injector for Semiconductor Implantation
Authors
  • A.A. Losev, P.N. Alekseev, N.N. Alexeev, T. Kulevoypresenter, A.D. Milyachenko, Yu.A. Satov, A. Shumshurov
    ITEP, Moscow, Russia
  • P.B. Lagov
    NUST MISIS, Moscow, Russia
  • M.E. Letovaltseva
    MIREA, Moscow, Russia
  • Y.S. Pavlov
    IPCE RAS, Moscow, Russia
Abstract Carbon implantation can be effectively used for axial minority charge carriers lifetime control in various silicon bulk and epitaxial planar structures. When carbon is implanted, more stable recombination centers are formed and silicon is not doped with additional impurities, as for example, when irradiated with protons or helium ions. Economically, such a process competes with alternative methods, and is more efficient for obtaining small lifetimes (several nanoseconds). I-3 ion injector with laser-plasma ion source in Institute for theoretical and experimental physics (ITEP) is used as ion implanter in semiconductors. The ion source uses pulsed CO₂ laser setup with radiation-flux density of 10¹¹ W/cm² at target surface. The ion source produces beams of various ions from solid targets. The generated ion beam is accelerated in the two gap RF resonator at voltage of up to 2 MV per gap. Resulting beam energy is up to 4 MV per charge. Parameters of carbon ion beam generated and used for semiconductor samples irradiation during experiments for axial minority charge carriers lifetime control in various silicon bulk and epitaxial planar structures are presented.
Paper download TUPAB057.PDF [1.290 MB / 3 pages]
Poster download TUPAB057_POSTER.PDF [0.630 MB]
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Conference IPAC2021
Series International Particle Accelerator Conference (12th)
Location Campinas, SP, Brazil
Date 24-28 May 2021
Publisher JACoW Publishing, Geneva, Switzerland
Editorial Board Liu Lin (LNLS, Campinas, Brazil); John M. Byrd (ANL, Lemont, IL, USA); Regis Neuenschwander (LNLS, Campinas, Brazil); Renan Picoreti (LNLS, Campinas, Brazil); Volker R. W. Schaa (GSI, Darmstadt, Germany)
Online ISBN 978-3-95450-214-1
Online ISSN 2673-5490
Received 15 May 2021
Accepted 28 May 2021
Issue Date 01 September 2021
DOI doi:10.18429/JACoW-IPAC2021-TUPAB057
Pages 1489-1491
Copyright
Creative Commons CC logoPublished by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI.