| Title |
Single Micron Single-Bunch Turn-by-Turn BPM Resolution Achieved at NSLS-II |
| Authors |
- B. Podobedov, W.X. Cheng, K. Ha, Y. Hidaka, J. Mead, O. Singh, K. Vetter
BNL, Upton, Long Island, New York, USA
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| Abstract |
NSLS-II state-of-the-art BPMs provide a single micron turn-by-turn BPM resolution for any bunch train of reasonable intensity. For certain beam dynamics studies a similar, or even better, resolution is desired for a single-, or a few-bunch fill, which is not yet available with our standard BPM signal processing. This paper describes our experience with more advanced BPM ADC signal processing which allowed us to significantly improve turn-by-turn BPM resolution in single bunch mode down to the level of about one micron at ~1 nC/bunch. We also present the examples of machine studies that benefit from this BPM performance enhancement.
|
| Paper |
download WEOBB01.PDF [1.007 MB / 4 pages] |
| Slides |
download WEOBB01_TALK.PDF [2.565 MB] |
| Export |
download ※ BibTeX
※ LaTeX
※ Text/Word
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※ EndNote |
| Conference |
IPAC2016, Busan, Korea |
| Series |
International Particle Accelerator Conference (7th) |
| Proceedings |
Link to full IPAC2016 Proccedings |
| Session |
Contributed Oral Presentaations, Beam Instrumentation and Feedback |
| Date |
11-May-16 11:30–12:30 |
| Main Classification |
06 Beam Instrumentation, Controls, Feedback and Operational Aspects |
| Sub Classification |
T03 Beam Diagnostics and Instrumentation |
| Keywords |
experiment, storage-ring, operation, collective-effects, Windows |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Dong Eon Kim (PAL, Pohang, Republic of Korea); Kyung Sook Kim (PAL, Pohang, Republic of Korea); In Soo Ko (POSTECH, Pohang, Republic of Korea); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-147-2 |
| Published |
June 2016 |
| Copyright |
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