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Programming the Measurement System by using VEE Pro to Determine Cyclic I-V Characteristics: Resistive Switching Device Application

Year 2023, Volume: 16 Issue: 1, 110 - 119, 31.03.2023
https://doi.org/10.18185/erzifbed.1168992

Abstract

In this study we introduce a simple program for cyclic current–voltage (I–V) measurements for bipolar and unipolar resistive switching devices. This program (Cyclic I-V, CYC-IV) was developed under the Keysight VEE Pro (Visual Engineering Environment Program) software and has a graphical interface. CYC-IV was developed for programming the Keysight B2912 Precision Source/Measure Unit (SMU) for I-V measurement of resistive switching devices in sweep mode. CYC-IV can be used in six different sweep mode. Moreover, the ramp rate, upper and lower limits of bias, cycle delay time and number of cycles easily define by user. Measurement results were visualized in three graphs that can be viewed simultaneously with the measurements.

References

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  • [2] A. Akkaya, E. Ayyıldız, Automation Software for Semiconductor Research Laboratories: Measurement System and Instrument Control Program (SeCLaS-IC), MAPAN, 35 (2020) 343-350.
  • [3] A. Cabrini, L. Gobbi, D. Baderna, G. Torelli, A compact low-cost test equipment for thermal and electrical characterization of integrated circuits, Measurement, 42 (2009) 281-289.
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  • [10] A. Haleem, M. Javaid, R.P. Singh, S. Rab, R. Suman, Hyperautomation for the enhancement of automation in industries, Sensors International, 2 (2021) 100124.
  • [11] Y. Chen, ReRAM: History, Status, and Future, Ieee T Electron Dev, 67 (2020) 1420-1433.
  • [12] M. Lanza, H.-S.P. Wong, E. Pop, et al., Recommended Methods to Study Resistive Switching Devices, Advanced Electronic Materials, 5 (2019) 1800143.
  • [13] Keysight, VEE Pro v9.33 User Manual in. https://www.keysight.com/us/en/assets/9018-41106/user-manuals/9018-41106.pdf (accessed 08.08.2022)
Year 2023, Volume: 16 Issue: 1, 110 - 119, 31.03.2023
https://doi.org/10.18185/erzifbed.1168992

Abstract

References

  • [1] A. Akkaya, E. Ayyıldız, Automation Software for Semiconductor Research Laboratories: Electrical Parameter Calculation Program (SeCLaS-PC), Journal of Circuits, Systems and Computers, 29 (2020) 2050215.
  • [2] A. Akkaya, E. Ayyıldız, Automation Software for Semiconductor Research Laboratories: Measurement System and Instrument Control Program (SeCLaS-IC), MAPAN, 35 (2020) 343-350.
  • [3] A. Cabrini, L. Gobbi, D. Baderna, G. Torelli, A compact low-cost test equipment for thermal and electrical characterization of integrated circuits, Measurement, 42 (2009) 281-289.
  • [4] P. Visconti, P. Costantini, C. Orlando, A. Lay-Ekuakille, G. Cavalera, Software solution implemented on hardware system to manage and drive multiple bi-axial solar trackers by PC in photovoltaic solar plants, Measurement, 76 (2015) 80-92.
  • [5] S. Wu, Electrical Automation Control System Based on Brovey Algorithm, in: 2022 IEEE Asia-Pacific Conference on Image Processing, Electronics and Computers (IPEC), 2022, pp. 1304-1308.
  • [6] O. Kahveci, M.F. Kaya, Farklı Metal/n-Si Kontakların Sayısal Olarak Modellenmesi ve Simülasyonu, Karadeniz Fen Bilimleri Dergisi, 12 (2022) 398-413. [7] E. Garzón, F. Sanchez, L.M. Procel, L. Trojman, Remote control of VNA and parameter analyzer for RFCV measurements using Python, in: 2016 IEEE ANDESCON, 2016, pp. 1-4.
  • [8] S.H. Bayes, S. Shukri, R.S. Balog, Low Cost, Stand-Alone, In-situ PV Curve Trace, in: 2020 2nd International Conference on Photovoltaic Science and Technologies (PVCon), 2020, pp. 1-6.
  • [9] D. Ursutiu, C. Samoila, P. Cotfas, D.T. Cotfas, D.V. Pop, M.E. Auer, D.G. Zutin, Multifunction iLab implemented laboratory, in: 2011 IEEE Global Engineering Education Conference (EDUCON), 2011, pp. 185-190.
  • [10] A. Haleem, M. Javaid, R.P. Singh, S. Rab, R. Suman, Hyperautomation for the enhancement of automation in industries, Sensors International, 2 (2021) 100124.
  • [11] Y. Chen, ReRAM: History, Status, and Future, Ieee T Electron Dev, 67 (2020) 1420-1433.
  • [12] M. Lanza, H.-S.P. Wong, E. Pop, et al., Recommended Methods to Study Resistive Switching Devices, Advanced Electronic Materials, 5 (2019) 1800143.
  • [13] Keysight, VEE Pro v9.33 User Manual in. https://www.keysight.com/us/en/assets/9018-41106/user-manuals/9018-41106.pdf (accessed 08.08.2022)
There are 12 citations in total.

Details

Primary Language English
Subjects Engineering
Journal Section Makaleler
Authors

Ersin Temel 0000-0002-8822-6674

Abdullah Akkaya 0000-0002-4086-6365

Early Pub Date March 29, 2023
Publication Date March 31, 2023
Published in Issue Year 2023 Volume: 16 Issue: 1

Cite

APA Temel, E., & Akkaya, A. (2023). Programming the Measurement System by using VEE Pro to Determine Cyclic I-V Characteristics: Resistive Switching Device Application. Erzincan University Journal of Science and Technology, 16(1), 110-119. https://doi.org/10.18185/erzifbed.1168992