Conclusion
High resolution electron microscopy has contributed a great deal to the materials science of bulk, interface, and defect structure. We can expect the contribution to grow in the future, with the biggest improvement coming from attempts to quantify pictorial data.
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Gibson, J.M. High Resolution Transmission Electron Microscopy. MRS Bulletin 16, 27–33 (1991). https://doi.org/10.1557/S0883769400057377
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DOI: https://doi.org/10.1557/S0883769400057377