Abstract
We have previously shown that the carrier drift mobility in amorphous silicon can be enhanced by optimizing the ion-bombardment energy during growth on conducting substrates. However, there exists a lack of reproducibility of samples exhibiting high mobility which we attribute to the rf field induced fluctuation of the plasma potential in a conventional (Te} ≈ 2eV) silane plasma. Here we introduce an enclosed plasma configuration that allows us to confine the effect of the rf field and therefore obtain a low-electron-temperature (Te ≈ 0.1 eV) silane plasma as determined from Langmuir probe measurements. The measured ion-energy distributions correlate with those for electrons and the mean ion-energy can be controlled by biasing the substrate which allows us to reproducibly fabricate high drift mobility amorphous silicon.
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References
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Acknowledgments
We would like to thank T. Nishimiya for assistance with analysis of the ion current data. This work is supported by the ‘New Sunshine Project’ of the Ministry of International Trade and Industry, Japan.
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Ganguly, G., Ikeda, T., Sakata, I. et al. Modified Triode Plasma Configuration Allowing Precise Control of Ion-Energy for Preparing High Mobility a-Si:H. MRS Online Proceedings Library 420, 347–352 (1996). https://doi.org/10.1557/PROC-420-347
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DOI: https://doi.org/10.1557/PROC-420-347