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Kinetic Roughening of Quenched Xenon Films

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Abstract

We investigate the growth of quenched Xe films formed by deposition onto a cold (15-35K) substrate via in situ measurements of x-ray reflectivity and diffraction. Surface roughness, film density, and crystallinity are determined as a function of Xe film thickness, substrate temperature and Xe flux in order to test for dynamic scaling behavior. Deposition of poly-crystalline films with random crystallite orientations is achieved through heating of a grafoil sheet that is enclosed in the sample cell and has previously been covered with bulk Xe. At 16K the films are sufficiently quenched to be stable over several days, while at 25K annealing takes place. Differing atomic mobilities at different temperatures lead to contrasting scaling behavior. The substrate remains unchanged under repeated film deposition and desorption and therefore allows a systematic comparison of different films.

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References

  1. F. Family and T. Vicsek, J. Phys. A 18, L75 (1985).

    Article  Google Scholar 

  2. A.-L. Barabási and H.E. Stanley, Fractal Concepts in Surface Growth (Cambridge University Press, Cambridge, 1995).

    Book  Google Scholar 

  3. C. Thompson, G. Palasantzas, Y.P. Feng, S.K. Sinha, and J. Krim, Phys. Rev. B 49, 4902 (1994).

    Article  CAS  Google Scholar 

  4. H. You, R.P. Chiarello, H.K. Kim, and K.G. Vandervoort, Phys. Rev. Lett. 70, 2900 (1993).

    Article  CAS  Google Scholar 

  5. W.R. Birch, M.A. Knewtson, S. Garoff, R.M. Suter, and S. Satija, Coll, and Surf. 89, 145 (1994); Langmuir 11, 48 (1995).

    Article  CAS  Google Scholar 

  6. J.A. Venables and P.S. Schabes-Retchikman, J. Physique 38, C4 105 (1977).

    Google Scholar 

  7. J.D. Shindler and R.M. Suter, Rev. Sci. Instrum. 63, 5343 (1992).

    Article  CAS  Google Scholar 

  8. R.K. Heilmann and R.M. Suter, work in progress.

  9. D. Bouzida, S. Kumar, and R.H. Swendsen, Phys. Rev. A 45, 8894 (1992).

    Article  CAS  Google Scholar 

  10. L. Nevot and P. Croce, Rev. Phys. Appl. 15, 761 (1980).

    Article  CAS  Google Scholar 

  11. G.H. Cheesman and C.M. Soane, Proc. Phys. Soc. 70 B, 700 (1957).

    Article  CAS  Google Scholar 

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Authors and Affiliations

  1. Department of Physics, Carnegie Mellon University, Pittsburgh, PA, 15213, USA

    Ralf K. Heilmann & Robert M. Suter

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  1. Ralf K. Heilmann
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  2. Robert M. Suter
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Heilmann, R.K., Suter, R.M. Kinetic Roughening of Quenched Xenon Films. MRS Online Proceedings Library 407, 239–244 (1995). https://doi.org/10.1557/PROC-407-239

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  • DOI: https://doi.org/10.1557/PROC-407-239