Abstract
We investigate the structural evolution of Er/Si nanoclusters obtained in co-implanted fused silica upon annealing via Raman spectroscopy and transmission electron microscopy. The effect of annealing temperature (900–1200 °C) on the nature and the relative fraction of the formed amorphous-Si, Si nanocrystals (Si-nc), and amorphous Er nanoparticles (Er-np) was determined in this ternary Er–Si–O system, showing a change of growth regime above 1100 °C due to the formation of mixed Er/O/Si aggregates. We observe that the nucleation and growth of amorphous Er-np and Si-nc are mutually affected. The 2-fold increase in the size of Er-np when no excess Si+ is present in the matrix indicates that the formation of Si-nc in the proximity of Er clusters hinders Er diffusivity above 1100 °C. This finding shows the importance of nanoclustering for improving the thermal stability of Er-doped silica systems.
Similar content being viewed by others
References
A. Kanjilal, L. Rebohle, M. Voelskow, W. Skorupa, and M. Helm: Influence of annealing on the Er luminescence in Si-rich SiO2 layers coimplanted with Er ions. J. Appl. Phys. 104, 103522 (2008).
D. Pacifici, G. Franzò, F. Priolo, F. Iacona, and L. Dal Negro: Modeling and perspectives of the Si nanocrystals-Er interaction for optical amplification. Phys. Rev. B 67, 2453011 (2003).
G. Franzò, V. Vinciguerra, and F. Priolo: Excitation mechanism of rare-earth ions in silicon nanocrystals. Appl. Phys. A 69, 3 (1999).
P. Pellegrino, B. Garrido, J. Arbiol, C. Garcia, Y. Lebour, and J.R. Morante: Site of Er ions in silica layers codoped with Si nanoclusters and Er. Appl. Phys. Lett. 88, 121915 (2006).
G. Franzò, S. Boninelli, D. Pacifici, F. Priolo, F. Iacona, and C. Bongiorno: Sensitizing properties of amorphous Si clusters on the 1.54-μm luminescence of Er in Si-rich SiO2. Appl. Phys. Lett. 82, 3871 (2003).
E. Talbot, R. Lardé, P. Pareige, L. Khomenkova, K. Hijazi, and F. Gourbilleau: Nanoscale evidence of erbium clustering in Er-doped silicon-rich silica. Nanoscale Res. Lett. 8(1), 1–8 (2013).
F. Priolo, G. Franzò, D. Pacifici, V. Vinciguerra, F. Iacona, and A. Irrera: Role of the energy transfer in the optical properties of undoped and Er-doped interacting Si nanocrystals. J. Appl. Phys. 89, 264 (2001).
X.D. Pi, O.H.Y. Zalloum, J. Wojcik, A.P. Knights, P. Mascher, A.D.W. Todd, and P.J. Simpson: Formation and oxidation of Si nanoclusters in Er-doped Si-rich SiOx. J. Appl. Phys. 97, 096108 (2005).
A. Polman, D.C. Jacobson, A. Lidgard, J.M. Poate, and G.W. Arnold: Photoluminescence and structural characterization of MeV erbium-implanted silica glass. Nucl. Instrum. Methods Phys. Res., Sect. B 59–60, 1313 (1991).
J. Thomas, M. Myara, L. Troussellier, E. Burov, A. Pastouret, D. Boivin, G. Melin, O. Gilard, M. Sotom, and P. Signoret: Radiation-resistant erbium-doped-nanoparticles optical fiber for space applications. Opt. Express 20, 2435 (2012).
A. Gusarov, M. Van Uffelen, M. Hotoleanu, H. Thienpont, and F. Berghmans: Radiation sensitivity of EDFAs based on highly Er-doped fibers. J. Lightwave Technol. 27, 1540 (2009).
I.F. Crowe, R.J. Kashtiban, B. Sherliker, U. Bangert, M.P. Halsall, A.P. Knights, and R.M. Gwilliam: Spatially correlated erbium and Si nanocrystals in coimplanted SiO2 after a single high temperature anneal. J. Appl. Phys. 107, 044316 (2010).
M. Zhang, R. Cai, Y. Zhang, C. Wang, Y. Wang, G.G. Ross, and D. Barba: Evolution of microstructural defects with strain effects in germanium nanocrystals synthesized at different annealing temperatures. Mater. Charact. 93, 1 (2014).
G. Faraci, S. Gibilisco, P. Russo, A.R. Pennisi, and S. La Rosa: Modified Raman confinement model for Si nanocrystals. Phys. Rev. B 73, 033307 (2006).
D. Barba, J. Demarche, F. Martin, G. Terwagne, and G.G. Ross: Control of the Ge nanocrystal synthesis by co-implantation of Si+. J. Appl. Phys. 114, 074306 (2013).
S. Laachira, M. Moussetadb, R. Adhirib, and A. Fahlia: Crystal-Field Energy Levels of Trivalent Erbium Ion in Cubic Symmetry. Z. Naturforsch. 66a, 457 (2011).
A. Merlen, A. Sangar, P. Torchio, L.N.D. Kallepalli, D. Grojo, O. Uteza, and P. Delaporte: Multi-wavelength enhancement of silicon Raman scattering by nanoscale laser surface ablation. Appl. Surf. Sci. 284, 545 (2013).
D. Mustafa, D. Biggemann, J.A. Martens, C.E.A. Kirschhock, L.R. Tessler, and E. Breynaert: Erbium enhanced formation and growth of photoluminescent Er/Si nanocrystals. Thin Solid Films 536, 196 (2013).
J.S. John, J.L. Coffer, Y. Chen, and R.F. Pinizzotto: Size control of erbium-doped silicon nanocrystals. Appl. Phys. Lett. 77, 1635 (2000).
Y.Q. Wang, R. Smirani, and G.G. Ross: The effect of implantation dose on the microstructure of silicon nanocrystals in SiO2. Nanotechnology 15, 1554 (2004).
Y-G.F. Ren: Er doped silicon as an optoelectronic semiconductor material. Ph.D. Thesis, Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, 1994.
F. Gourbilleau, M. Levalois, C. Dufour, J. Vicens, and R. Rizk: Optimized conditions for an enhanced coupling rate between Er ions and Si nanoclusters for an improved 1.54-μm emission. J. Appl. Phys. 95, 3717 (2004).
C.S. Zhang, J.Z. Sun, and F. Zhang: Structure and composition evolutions of Er-doped Si-rich SiO2 film under annealing. Microelectron. Eng. 81, 378 (2005).
D. Yan, P. Wu, S.P. Zhang, L. Liang, F. Yang, Y.L. Pei, and S. Chen: Assignments of the Raman modes of monoclinic erbium oxide. J. Appl. Phys. 114, 193502 (2013).
H. Isshiki, M.J.A. De Dood, A. Polman, and T. Kimura: Self-assembled infrared-luminescent Er–Si–O crystallites on silicon. Appl. Phys. Lett. 85, 4343 (2004).
A. Polman: Erbium implanted thin film photonic materials. J. Appl. Phys. 82, 1 (1997).
D. Kollewe, T. Bachmann, and W. Sigle: Redistribution of implanted Er in SiO2 on Si studied by combined transmission electron microscopy and Rutherford backscattering analysis. Phys. Lett. A 253, 305 (1999).
ACKNOWLEDGMENTS
This work was partly supported by the NSERC Strategic Grant STPGP 447377-13 in partnership with MPB Technologies Inc. F.R. acknowledges NSERC for a EWR Steacie Memorial Fellowship. F.R. and A.R. are supported by individual Discovery Grants (NSERC). F.R. acknowledges the Alexander von Humboldt Foundation for a FW Bessel Award.
Author information
Authors and Affiliations
Corresponding authors
Rights and permissions
About this article
Cite this article
Celikin, M., Barba, D., Ruediger, A. et al. Co-mediated nucleation of erbium/silicon nanoclusters in fused silica. Journal of Materials Research 30, 3003–3010 (2015). https://doi.org/10.1557/jmr.2015.277
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1557/jmr.2015.277