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Electromigration and IC Interconnects

  • Materials Reliability in Microelectronics
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Authors
  1. Carl V. Thompson
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  2. James R. Lloyd
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Thompson, C.V., Lloyd, J.R. Electromigration and IC Interconnects. MRS Bulletin 18, 19–25 (1993). https://doi.org/10.1557/S088376940003904X

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