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Licensed Unlicensed Requires Authentication Published by De Gruyter May 8, 2013

Aluminum localization in the cell walls of the mature xylem of maple tree detected by elemental imaging using time-of-flight secondary ion mass spectrometry (TOF-SIMS)

  • Kaori Saito , Yoko Watanabe , Yasuyuki Matsushita , Takanori Imai , Takayoshi Koike , Yuzou Sano , Ryo Funada , Kazumi Fukazawa and Kazuhiko Fukushima EMAIL logo
From the journal Holzforschung

Abstract

The distribution of aluminum (Al) and other inorganic elements has been mapped at the cellular level in the mature xylem of maple by means of time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging. This method permits to image inorganic elements along with organic molecular species with high spatial resolution, and it was demonstrated that Na, K, Ca, and Mg are almost uniformly distributed in several contiguous growth rings of the air-dried wood sample. In contrast, Al was accumulated heterogeneously and intensely in the cell walls of the secondary xylem, including several growth rings, despite the long-term air-drying during storage. These results are interpreted that Al is immobilized within the cell wall, or it is closely interacted with the components of the secondary xylem. TOF-SIMS mapping also shows that Al has a tendency to be localized around vessels in the inner rings.


Corresponding author: Kazuhiko Fukushima, Graduate School of Bioagricultural Sciences, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8601, Japan, Phone: +81-52-789-4159, Fax: +81-52-789-4163, e-mail:

We thank Akira Yamamoto and Shinichi Iida (ULVAC-PHI Co. Ltd., Japan) and Toshiyuki Kato and Ruka Takama (Technical Center, Nagoya University, Nagoya, Japan) for the technical support with the TOF-SIMS measurements.

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Received: 2012-12-13
Accepted: 2013-4-8
Published Online: 2013-05-08
Published in Print: 2014-01-01

©2014 by Walter de Gruyter Berlin Boston

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