Chan,, Chi-Ming and Weng,, Lu-Tao. "APPLICATIONS OF X-RAY PHOTOELECTRON SPECTROSCOPY AND STATIC SECONDARY ION MASS SPECTROMETRY IN SURFACE CHARACTERIZATION OF COPOLYMERS AND POLYMERS BLENDS"
Reviews in Chemical Engineering, vol. 16, no. 4, 2000, pp. 341-408.
https://doi.org/10.1515/REVCE.2000.16.4.341
Chan,, C. & Weng,, L. (2000). APPLICATIONS OF X-RAY PHOTOELECTRON SPECTROSCOPY AND STATIC SECONDARY ION MASS SPECTROMETRY IN SURFACE CHARACTERIZATION OF COPOLYMERS AND POLYMERS BLENDS.
Reviews in Chemical Engineering,
16(4), 341-408.
https://doi.org/10.1515/REVCE.2000.16.4.341
Chan,, C. and Weng,, L. (2000) APPLICATIONS OF X-RAY PHOTOELECTRON SPECTROSCOPY AND STATIC SECONDARY ION MASS SPECTROMETRY IN SURFACE CHARACTERIZATION OF COPOLYMERS AND POLYMERS BLENDS. Reviews in Chemical Engineering, Vol. 16 (Issue 4), pp. 341-408.
https://doi.org/10.1515/REVCE.2000.16.4.341
Chan,, Chi-Ming and Weng,, Lu-Tao. "APPLICATIONS OF X-RAY PHOTOELECTRON SPECTROSCOPY AND STATIC SECONDARY ION MASS SPECTROMETRY IN SURFACE CHARACTERIZATION OF COPOLYMERS AND POLYMERS BLENDS"
Reviews in Chemical Engineering 16, no. 4 (2000): 341-408.
https://doi.org/10.1515/REVCE.2000.16.4.341
Chan, C, Weng, L. APPLICATIONS OF X-RAY PHOTOELECTRON SPECTROSCOPY AND STATIC SECONDARY ION MASS SPECTROMETRY IN SURFACE CHARACTERIZATION OF COPOLYMERS AND POLYMERS BLENDS.
Reviews in Chemical Engineering. 2000;16(4): 341-408.
https://doi.org/10.1515/REVCE.2000.16.4.341
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