e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Conference -XAFS Theory-
A Critical Assessment of Multiple Scattering Expansions
D. SébilleauK. HatadaH. -F. ZhaoC. R. Natoli
Author information
JOURNAL FREE ACCESS

2012 Volume 10 Pages 599-608

Details
Abstract

We propose a comparative and critical assessment of multiple scattering expansions. The so-called multiple scattering series expansion is much used in the description of spectroscopies at higher energies. However, it is plagued with convergence problems when operated at lower energies. We compare this method to related methods that can be found in the literature, relying both on finite and infinite expansions. After discussing the pros and cons of these methods, we establish a simple alternative to multiple scattering series expansion which has a wider and faster range of convergence. [DOI: 10.1380/ejssnt.2012.599]

Content from these authors

この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by/4.0/deed.ja
Previous article Next article
feedback
Top