Abstract
A highly sensitive photodetection system with a detection limit of was developed. This system uses a commercially available -diameter silicon avalanche photodiode (APD) and an in-house-developed ultralow-noise readout circuit, which are both cooled to 77 K. When the APD operates at a low gain of , it has a high-linearity response to the number of incident photons and a low excess noise factor. The APD also has a high quantum efficiency and a dark current of less than at 77 K. This photodetection system will shorten measurement time and permit higher spatial and wavelength resolution for near-field scanning optical microscopes.
© 2005 Optical Society of America
Full Article | PDF ArticleMore Like This
Kenji Tsujino, Makoto Akiba, and Masahide Sasaki
Appl. Opt. 46(7) 1009-1014 (2007)
Makoto Akiba and Mikio Fujiwara
Opt. Lett. 28(12) 1010-1012 (2003)
S. Lee, X. Jin, H. Jung, H. Lewis, Y. Liu, B. Guo, S. H. Kodati, M. Schwartz, C. Grein, T. J. Ronningen, J. P. R. David, Joe. C. Campbell, and S. Krishna
Optica 10(2) 147-154 (2023)