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From Carrier Dynamics inside Fused Silica to Control of Multiphoton-Avalanche Ionization for Laser Machining

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Abstract

Using pump-probe measurements, we characterize carrier decay time inside fused silica and measure deeply bound self-trapped excitons. With pump-probe delay, we also control free carrier injection and the subsequent avalanche process for laser machining applications.

© 2010 Optical Society of America

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