上海光源先进成像技术及应用
谢红兰邓彪杜国浩彭冠云付亚楠郭瀚和友朱文选肖体乔
中国科学院上海应用物理研究所
Abstract: ＜正＞由于X射线波长比可见光短得多,用它来进行成像时,在理论上分辨率要比可见光高2~4个量级。而且X射线的穿透性较强,可对厚样品的内部结构进行无损检测,这是其他各种显微术所不具备的。自从伦琴1895年发现X射线以来,传统的X射线成像技术已有上百年的历史,已成为医学、生物学
- DOI：
10.13405/j.cnki.xdwz.2010.03.006
- Series：
- Subject：
- Classification Code：
O434.1
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