年次大会講演論文集
Online ISSN : 2433-1325
セッションID: T0302-2-3
会議情報
T0302-2-3 立体配向顕微鏡を用いた非接触・非破壊歪み計測([T0302-2]高信頼マイクロ・ナノデバイスのための設計・計測技術(2):応力・ひずみ計測)
吉木 啓介増田 恭佑橋本 守橋本 信幸栗原 誠生津 資大井上 尚三
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会議録・要旨集 認証あり

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We developed a system to analyze microscopic deformation, which can visualize inhomogeneous deformation in MEMS(Micro Electro Mechanical Systems) devices by using single-molecule markers. As MEMS devices become smaller, their mechanical properties seem to become inhomogeneous. This causes an undesirable distribution of deformation and stress, and decreases the reliability of the MEMS devices. We distributed fluorescent single molecules discretely on the microstructure of a MEMS device, and traced their relative displacements and rotations by observation under a three-dimensional orientation microscope, which provided information about normal, torsional, and bending displacements.

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