ABSTRACT
The development of optical fibre technology has had a revolutionary impact on telecommunications. In conjunction with that revolution researchers have developed a wide variety of optical fibre sensors. For both of these technologies, the analysis of high quality images of fibres and waveguides gives information crucial to the optimisation and improved manufacture of these devices. In this paper we demonstrate the capabilities of confocal fluorescence microscopy, and DIC microscopy to obtain high quality information on dopant concentration and refractive index.
