A Method for Measuring Strain by Analyzing Sharpness of ECP With
Image Analysis

Yoshitomi, Y.; Ohta, K.; Harase, J.; Suga, Y.

doi:https://doi.org/10.1155/TSM.22.199

Texture, Stress, and Microstructure

On this page

Abstract Copyright Related Articles

Open Access

Volume 22 | Article ID 251085 | https://doi.org/10.1155/TSM.22.199

A Method for Measuring Strain by Analyzing Sharpness of ECP With Image Analysis

Y. Yoshitomi,¹K. Ohta,²J. Harase,¹and Y. Suga¹

Received20 Sept 1990

Accepted10 Dec 1993

Abstract

A method for measuring strain by analyzing sharpness of Electron Channeling Pattern (ECP) with Image analysis has been newly developed. The relative value of sharpness of first-order pseudo-Kikuchi line in ECP is used as a parameter of strain. Strain change of Fe-3.25%Si alloy single crystal and polycrystal during deformation and recrystallization was analyzed by this method. This method was compared with the conventional methods; hardness and line broadening of X-ray. This method can be used for measuring strain in material with any crystal orientation.

Copyright

Copyright © 1994 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

PDF Download Citation Order printed copies

Views

222

Downloads

0

Citations