VLSI Design 
Volume 2008 (2008), Article ID 482159, 8 pages
doi:10.1155/2008/482159
Research Article

ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator

V. Kerzérho,1,2 P. Cauvet,2 S. Bernard,1 F. Azaïs,1 M. Renovell,1 M. Comte,1 and O. Chakib1,2

 1LIRMM, University of Montpellier/CNRS, 161 rue Ada, 34392 Montpellier, France
2NXP Semiconductors, 2 esplanade Anton Philips, Campus EffiScience, BP 20000, 14906 Caen Cedex 9, France
Received 30 September 2007; Revised 15 January 2008; Accepted 18 February 2008

Recommended by José Machado da Silva

Abstract

Standard production test techniques for ADC require an ATE with an arbitrary waveform generator (AWG) with a resolution at least 2 bits higher than the ADC under test resolution. This requirement is a real issue for the new high-performance ADCs. This paper proposes a test solution that relaxes this constraint. The technique allows the test of ADC harmonic distortions using only low-cost ATE. The method involves two steps. The first step, called the learning phase, consists in extracting the harmonic contributions from the AWG. These characteristics are then used during the second step, called the production test, to discriminate the harmonic distortions induced by the ADC under test from the ones created by the generator. Hardware experimentations are presented to validate the proposed approach.