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CONCERT: a concurrent transient fault simulator for nonlinear analog circuits

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International Conference on Computer Aided Design archive
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design table of contents

San Jose, California, United States

Pages: 384 - 391

Year of Publication: 1998

ISBN:1-58113-008-2

Authors

Junwei Hou	School of Electrical and Compute Engineering, Georgia Institute of Technology, Atlanta, GA
Abhijit Chatterjee	School of Electrical and Compute Engineering, Georgia Institute of Technology, Atlanta, GA

Sponsors

SIGDA: ACM Special Interest Group on Design Automation
IEEE-CS : Computer Society
IEEE-EDS : Electronic Devices Society
IEEE-CAS : Circuits & Systems

Publisher

ACM New York, NY, USA

Bibliometrics

Downloads (6 Weeks): 0, Downloads (12 Months): 17, Citation Count: 3

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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CITED BY 3

	Heebyung Yoon , Junwei Hou , Swapan K. Bhattacharya , Abhijit Chatterjee , Madhavan Swaminathan, Fault Detection and Automated Fault Diagnosis for Embedded Integrated Electrical Passives, Journal of VLSI Signal Processing Systems, v.21 n.3, p.265-276, July 1999
	Sudip Chakrabarti , Abhijit Chatterjee, Partial simulation-driven ATPG for detection and diagnosis of faults in analog circuits, Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design, November 05-09, 2000, San Jose, California
	Nur Engin , Hans G. Kerkhoff, Fast Fault Simulation for Nonlinear Analog Circuits, IEEE Design & Test, v.20 n.2, p.40-47, March 2003