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Performance-constrained worst-case variability minimization of VLSI circuits
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 30th international conference on Design automation table of contents
Dallas, Texas, United States
Pages: 154 - 158  
Year of Publication: 1993
ISBN:0-89791-577-1
Authors
Sponsors
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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R. N. Kackar, "Off-line quality control, parameter design and the Taguchi method," J. of Quality Technology, vol. 17, pp. 176-206, Oct. 1985.
 
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T. K. Yu, S. M. Kang, I. N. Hajj, and T. N. Trick, "Statistical modeling of VLSI circuit performances," IEEE Trans. Computer-Aided Design, vol. CAD-6, pp. 1013- 1022, Nov. 1989.
 
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R. M. Biernacki and M. A. Styblinski, "Statistical circuit design with a dynamic constraint approximation scheme," Proc. IEEE ISCAS, pp. 976-979, 1986. San Jose, CA.
 
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G. Taguchi, "Off-line and on-line quality control systems," Proc. of International Conference on Quality Control, 1987. Tokyo, Japan.
 
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M. A. Styblinski and J. C. Zhang, "Circuit performance variability reduction: Principles, problems, and practical solutions," Proc. IEEE ICCAD, pp. 170- 173, Nov. 1991. Santa Clara, CA.
 
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M. D. McKay, It. J. Beckman, and W. J. Conover, "A comparison of three methods for selecting values of input variables in the analysis of output from a computer code," Technometrics, vol. 21, pp. 239-245, May 1979.
 
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A. Dharchoudhury and S. M. Kang, "iEDISON3.0: A users' guide," 1992.
 
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P. E. Gill, W. Murray, M. A. Saunders, and M. H. Wright, User's Guide .for NPSOL, version 4.0. Department of Operations Research, Stanford, California, 1986. Report SOL86-2.


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A. Dharchoudhury: colleagues
S. M. Kang: colleagues

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