| REX—a VLSI parasitic extraction tool for electromigration and signal analysis |
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Annual ACM IEEE Design Automation Conference
archive
Proceedings of the 28th conference on ACM/IEEE design automation
table of contents
San Francisco, California, United States
Pages: 717 - 722
Year of Publication: 1991
ISBN:0-89791-395-7
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Author
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Jerry P. Hwang
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Digital Equipment Corporation, 77 Reed Road, Hudson, MA
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Downloads (6 Weeks): 3, Downloads (12 Months): 17, Citation Count: 1
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REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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Bark85
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Bent75
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Chaw70
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B. R. Chawla, H. K. Gummel, "A Boundary technique for Calculation of Distributed Resistance," IEEE Trans. Electron Devices, Vol. ED-17, No. 10, Oct. 1970.
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Hall87
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J. E. Hall, D. E. Hocevar, P. Yang, M. J. McGraw, "SPIDER-- A CAD System for Modeling VLSI MetaUization Patterns," IEEE Trans. CAD, Vol. CAD.6, No. 6. Nov. 1987.
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Horo83
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M. Horowitz, R.W. Dutton, "Resistance Extraction from Mask Layout Data," IEEE Trans. CAD, Vol. CAD.2, No. 3. July 1983.
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Rose85
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J. B. Rosenberg, "Geographical Data Structures Compared: A Study of Data Structures Supporting Region Queries," IEEE Trans. CAD, Vol. CAD-4, No. 1. Jan. 1985.
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Scot85
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Star87
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