Abstract
In this paper, an anisotropic diffusion filter was employed to extract a background image in a thin film transistor liquid crystal display (TFT-LCD) panel image. The background image extracted by an iterative filtering was simply subtracted from a test image to detect blob-Mura defects. To reduce a processing time, we simply modified a conventional anisotropic diffusion filter and evaluated its results. The black and white bob-Mura defects which were included in the same image could be detected separately using only threshold values. Through simulation it was verified that the proposed method has a superior capability of detecting blob-Mura defects.