Generation of Solid-Source H2O Plasma and Its Application to Dry Etching of CaF2

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Published 20 June 2008 Copyright (c) 2008 The Japan Society of Applied Physics
, , Citation Akihiro Matsutani et al 2008 Jpn. J. Appl. Phys. 47 5113 DOI 10.1143/JJAP.47.5113

1347-4065/47/6S/5113

Abstract

We demonstrate the discharge of H2O plasma generated by solid-source H2O placed in a process chamber. Also, we investigated the dry etching process of CaF2 using solid-source H2O (ice) plasma. The average roughness of the etched surface was about 1 nm for an etching depth of in 2 µm which satisfies the requirements for optical device fabrication. We believe that the proposed CaF2 etching process is suitable for the fabrication of optical devices such as gratings or Fresnel lenses. In addition, we think that the H2O plasma including OH radicals obtained by this proposed method may be useful for sterilization and as a new UV light source.

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10.1143/JJAP.47.5113