Quantitative Analysis of Polarization Phenomena in CdTe Radiation Detectors

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Published 8 November 2006 Copyright (c) 2006 The Japan Society of Applied Physics
, , Citation Hiroyuki Toyama et al 2006 Jpn. J. Appl. Phys. 45 8842 DOI 10.1143/JJAP.45.8842

1347-4065/45/11R/8842

Abstract

Polarization phenomena in a Schottky-type CdTe radiation detector were studied. We evaluated the distribution of electric field in a biased CdTe detector by measuring the progressive change of Schottky barrier lowering with time. The parameters of deep acceptors such as detrapping time, concentration, and the depth of the energy level were quantitatively evaluated. In the case of applying the conventional model of charge accumulation, the obtained result shows that the CdTe bulk is never undepleted. We modified the charge accumulation model by taking account of the occupation state of the deep acceptor level. When a modified model is applied, the time that the depletion width in the bulk begins to diminish closely fits the time that the photopeak position begins to shift in radiation measurements. In this paper, we present a distribution of electric field during biasing and a simple method for the evaluation of the parameters of deep acceptors in CdTe bulk.

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