Crystallographic Polarity and Etching Behavior of ZnSe

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Copyright (c) 1977 The Japan Society of Applied Physics
, , Citation Atsuko Ebina et al 1977 Jpn. J. Appl. Phys. 16 1563 DOI 10.1143/JJAP.16.1563

1347-4065/16/9/1563

Abstract

The crystallographic polarity of ZnSe has been identified uniquely by employing X-ray diffraction techniques. The X-ray identification has been correlated with the etch-pit figures formed on the (111)Zn and (bar 1bar 1bar 1) Se surfaces. When etched with the K2Cr2O7-H2SO4 solution, the (111) surface is highly polished, while the (bar 1bar 1bar 1) surface forms triangular pyramidal shaped pits with positive orientation. Subsequently etched with the NaOH solution, triangular pyramidal shaped pits with negative orientation are formed on the (111) surface, and the positively oriented pits on the (bar 1bar 1bar 1) surface formed by the K2Cr2O7-H2SO4 solution develop into negatively oriented pits in triangular pyramidal shape and in addition, triangular pits with flat bottom are formed on the (bar 1bar 1bar 1) surface. A similarity in etching behavior has been found between the ZnSe crystals grown from the melt and grown by sublimation techniques.

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10.1143/JJAP.16.1563