Abstract.
Broadband Dielectric Spectroscopy (BDS) and Ellipsometry are combined to study the glassy dynamics of nanometric layers (≥ 5 nm) of polystyrene. For the former, two types of sample arrangement are applied, that is, the conventional method where evaporated metal electrodes are used and a novel technique in which insulating silica nanostructures serve as spacers between highly conducting doped silicon counter electrodes. Within the limits of the experimental accuracy (± 2 K) both approaches, BDS and Ellipsometry, deliver the coinciding result that – compared to the bulk – the glassy dynamics is not shifted. Furthermore the dielectric measurements do not indicate any broadening of the relaxation time distribution function, independent of the sample geometry employed.
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Mapesa, E., Erber, M., Tress, M. et al. Glassy dynamics in nanometer thin layers of polystyrene. Eur. Phys. J. Spec. Top. 189, 173–180 (2010). https://doi.org/10.1140/epjst/e2010-01320-2
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DOI: https://doi.org/10.1140/epjst/e2010-01320-2