Abstract
Pulsed EMF in resistive thick-film Ag–Pd elements is experimentally studied when their surface is irradiated with a laser beam. The dependences of the pulsed EMF on the coordinate of the action of the laser beam on the film surface are obtained. It is shown that applying a constant bias voltage to a thick-film resistive element can significantly increase the amplitude of unipolar EMF pulses induced by laser pulses. It was found that the amplitude and frequency of the EMF signals depend, respectively, on the power and frequency of laser pulses. It is shown that by the value of the pulsed EMF it is possible to control the parameters of the high-power laser radiation incident on the surface in real time. The design of a receiver for recording the parameters of laser radiation based on an Ag–Pd sensitive element has been developed. The sensitivity of the device for measuring the power and pulse repetition rate is estimated.
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The paper was made with the support of RFBR grant 18-48-180005 p_a.
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Aleksandrov, V.A., Besogonov, V.V. & Kalyuzhnyi, D.G. Pulse Conductivity in Ag–Pd Resistors Induced by Laser Pulses. Tech. Phys. 68 (Suppl 2), S322–S324 (2023). https://doi.org/10.1134/S1063784223900206
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DOI: https://doi.org/10.1134/S1063784223900206