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On the possibility of detecting near-surface technological stresses in ceramics by photoacoustic microscopy

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Abstract

The influence of near-surface technological stresses on the photoacoustic images of Vickers pyramid indentations in silicon nitride ceramics is studied experimentally. It is found that grinding- and polishing-induced stresses in the ceramics influence the behavior of photoacoustic signals coming from the ends of surface cracks. Photoacoustic microscopy data obtained from Vickers-indented areas near the ends of cracks make it possible to estimate technological stresses.

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Correspondence to A. L. Glazov.

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Original Russian Text © A.L. Glazov, K.L. Muratikov, 2009, published in Zhurnal Tekhnicheskoĭ Fiziki, 2009, Vol. 79, No. 3, pp. 105–109.

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Glazov, A.L., Muratikov, K.L. On the possibility of detecting near-surface technological stresses in ceramics by photoacoustic microscopy. Tech. Phys. 54, 431–434 (2009). https://doi.org/10.1134/S1063784209030189

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  • DOI: https://doi.org/10.1134/S1063784209030189

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