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Ion-plasma treatment of reed switch contacts: A study by time-of-flight secondary ion mass spectrometry

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Abstract

A TOF.SIMS-5 time-of-flight secondary ion mass spectrometer operating with pulsed 25-keV Bi+ ions for analysis and 2-keV Cs+ ions for sputter ion-beam etching was employed for studying the near-surface composition of iron-nickel (permalloy) contacts (blades) after the treatment in pulsed nitrogen plasma directly in hermetically sealed reed switches. The formation of 20- to 25-nm thick oxynitride coatings in the contacting region of the blades was observed. It was found that this coating was of the diffusive nature and produced via the plasma nitriding of the contacts.

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Authors and Affiliations

  1. Centre for Physics and Technological Research (CeFITec), Dept. de Fisica da Faculdade de Ciências e Tecnologia (FCT), Universidade Nova de Lisboa, Campus de Caparica, 2829-516, Caparica, Portugal

    A. B. Tolstoguzov & Orlando M. N. D. Teodoro

  2. Institute for Physics of Microstructures, Russian Academy of Sciences (IPM RAS), Nizhni Novgorod, 603950, Russia

    M. N. Drozdov

  3. Ryazan Metal Ceramics Instrumentation Plant Joint Stock Company (RMCIP), ul. Novaya 51B, Ryazan, 390027, Russia

    I. A. Zeltser & K. A. Arushanov

Authors
  1. A. B. Tolstoguzov
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  2. M. N. Drozdov
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  3. I. A. Zeltser
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  4. K. A. Arushanov
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  5. Orlando M. N. D. Teodoro
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Correspondence to A. B. Tolstoguzov.

Additional information

Original Russian Text © A.B. Tolstoguzov, M.N. Drozdov, I.A. Zeltser, K.A. Arushanov, Orlando M.N.D. Teodoro, 2013, published in Mass-spektrometria, 2013, Vol. 10, No. 3, pp. 167–173.

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Tolstoguzov, A.B., Drozdov, M.N., Zeltser, I.A. et al. Ion-plasma treatment of reed switch contacts: A study by time-of-flight secondary ion mass spectrometry. J Anal Chem 69, 1245–1251 (2014). https://doi.org/10.1134/S1061934814130115

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  • DOI: https://doi.org/10.1134/S1061934814130115

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