Abstract
The triple-crystal high-resolution X-ray diffraction scheme has been experimentally and theoretically investigated using reciprocal space mapping. The procedure for calculating the spectral angular instrumental functions of diffractometer to take into account the influence of mirror, monochromator, analyzer, and slits on the intensity distribution near reciprocal lattice point is described. Good coincidence of calculated and experimental cross sections of reciprocal space maps (RSMs) is shown by an example of a perfect Si(110) single crystal.
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ACKNOWLEDGMENTS
We are grateful to Yu.V. Pisarevsky for the discussion of the results and to O.A. Kondrat’ev for the help in carrying out experiments.
Funding
This study was supported by the Ministry of Science and Higher Education of the Russian Federation within a state contract with the Federal Scientific Research Centre “Crystallography and Photonics” of the Russian Academy of Sciences and supported in part by the Russian Foundation for Basic Research, project nos. 16-29-14057 ofi_m and 16-32-60120 mol_a_dk.
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Translated by Yu. Sin’kov
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Seregin, A.Y., Prosekov, P.A., Chukhovsky, F.N. et al. Experimental and Theoretical Study of the Triple-Crystal High-Resolution X-Ray Diffraction Scheme in Reciprocal Space Mapping Technique. Crystallogr. Rep. 64, 545–552 (2019). https://doi.org/10.1134/S1063774519040175
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DOI: https://doi.org/10.1134/S1063774519040175