Characterization of carbon nano-materials by apertureless near-field scanning optical microscope-Raman spectroscopy

Kyoung-Duck Park; Yong Hwan Kim; Jin Ho Park; Jung Su Park; Young-Hee Lee; Mun Seok Jeong

doi:10.1117/12.931647

9 October 2012 Characterization of carbon nano-materials by apertureless near-field scanning optical microscope-Raman spectroscopy

Kyoung-Duck Park, Yong Hwan Kim, Jin Ho Park, Jung Su Park, Young-Hee Lee, Mun Seok Jeong

Author Affiliations +

Proceedings Volume 8462, Carbon Nanotubes, Graphene, and Associated Devices V; 84620J (2012) https://doi.org/10.1117/12.931647
Event: SPIE NanoScience + Engineering, 2012, San Diego, California, United States

Abstract

In this study, an apertureless near-field scanning optical microscope-Raman spectroscopy system is constructed and the topography and Raman scattering image of carbon nano-materials are simultaneously measured with high spatial resolution by using a sharp Au tip. The Rayleigh scattering image, and Raman scattering image of the carbon nanotubes showed improved spatial resolution and enhanced scattering intensity owing to the optical antenna effect of Au tip.

Citation Download Citation

Kyoung-Duck Park, Yong Hwan Kim, Jin Ho Park, Jung Su Park, Young-Hee Lee, and Mun Seok Jeong "Characterization of carbon nano-materials by apertureless near-field scanning optical microscope-Raman spectroscopy", Proc. SPIE 8462, Carbon Nanotubes, Graphene, and Associated Devices V, 84620J (9 October 2012); https://doi.org/10.1117/12.931647

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