Paper
6 April 2012 Large substructure identification using substructure isolation method
Jilin Hou, Lukasz Jankowski, Jinping Ou
Author Affiliations +
Abstract
Substructure Isolation Method (SIM) is used for large substructure identification. It utilizes the responses of global structure to construct the responses of the isolated substructure, which is a virtual and independent structure with the same system parameters as the real substructure. Then, the substructure identification is carried out equivalently via the isolated substructure and flexibly by some of the existing identification methods which aim originally at the large structure. Therefore, the performance of the SIM offers the possibility that the large substructure can be identified. A numerical bridge model is used to verify the proposed method, which preforms efficiently and accurately.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jilin Hou, Lukasz Jankowski, and Jinping Ou "Large substructure identification using substructure isolation method", Proc. SPIE 8345, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2012, 83453V (6 April 2012); https://doi.org/10.1117/12.915102
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Cited by 2 scholarly publications.
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KEYWORDS
Sensors

Bridges

Finite element methods

Structural health monitoring

Aerospace engineering

Civil engineering

Electroluminescence

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