Challenges in polarization ray tracing

Russell A. Chipman

doi:10.1117/12.868939

9 September 2010 Challenges in polarization ray tracing

Russell A. Chipman

Proceedings Volume 7652, International Optical Design Conference 2010; 76521U (2010) https://doi.org/10.1117/12.868939
Event: International Optical Design Conference 2010, 2010, Jackson Hole, WY, United States

Abstract

New polarization methods allow the ray tracing simulation of polarization critical components, including multilayer biaxial films, anisotropic and gyrotropic crystals, electro-optical, and magneto-optical materials bring many new challenges.

Citation Download Citation

Russell A. Chipman "Challenges in polarization ray tracing", Proc. SPIE 7652, International Optical Design Conference 2010, 76521U (9 September 2010); https://doi.org/10.1117/12.868939

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