Potential for focused beam orthovoltage therapy

Dip N. Mahato; C. A. MacDonald

doi:10.1117/12.861764

20 September 2010 Potential for focused beam orthovoltage therapy

Dip N. Mahato, C. A. MacDonald

Proceedings Volume 7806, Penetrating Radiation Systems and Applications XI; 78060F (2010) https://doi.org/10.1117/12.861764
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States

Abstract

Radiation therapy typically employs high energy photon beams because the low absorption coefficient at these energies minimizes skin dose with a conventional, unfocused beam. At orthovoltage energies less than 150 keV, the maximum dose for a single beam occurs very close to the skin surface. However a well-focused beam of low energy x rays can provide much higher flux at the target depth while sparing dose to the skin. The measured focal spot size for the polycapillary optic was 0.2 mm and was found to remain unchanged through 50 mm of phantom thickness. The calculated depth-dose curve was found to peak several centimeters below the surface with 25-40 keV radiation. Modeling indicates that the tumor dose would remain much higher than the skin dose even after scanning to cover a 1 cm³ tumor.

Citation Download Citation

Dip N. Mahato and C. A. MacDonald "Potential for focused beam orthovoltage therapy", Proc. SPIE 7806, Penetrating Radiation Systems and Applications XI, 78060F (20 September 2010); https://doi.org/10.1117/12.861764

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