Reliability of diode lasers for space applications

K. Häusler; U. Zeimer; B. Sumpf; F. Bugge; P. Ressel; G. Erbert; G. Tränkle

doi:10.1117/12.809111

23 February 2009 Reliability of diode lasers for space applications

K. Häusler, U. Zeimer, B. Sumpf, F. Bugge, P. Ressel, G. Erbert, G. Tränkle

Proceedings Volume 7198, High-Power Diode Laser Technology and Applications VII; 719816 (2009) https://doi.org/10.1117/12.809111
Event: SPIE LASE: Lasers and Applications in Science and Engineering, 2009, San Jose, California, United States

Abstract

Qualification results of diode lasers for space applications are presented. Quantum well lasers (AlGaAs / GaAsP at 808 nm) were subjected to accelerated life test. No sudden failure was observed for 120 emitters at different stress conditions over 10,000 hours. Gradual degradation after more than 20,000 hours was modeled by recombination enhanced defect generation and statistically analyzed by the non-linear mixed effects model. The gradually degraded devices were investigated with cathodoluminescence. Statistical inference indicates the reliable operation of diode lasers throughout the typical life time of space equipment.

Citation Download Citation

K. Häusler, U. Zeimer, B. Sumpf, F. Bugge, P. Ressel, G. Erbert, and G. Tränkle "Reliability of diode lasers for space applications", Proc. SPIE 7198, High-Power Diode Laser Technology and Applications VII, 719816 (23 February 2009); https://doi.org/10.1117/12.809111

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