Resistor array infrared projector nonuniformity correction: search for performance improvement III

Robert A. Joyce; Leszek Świerkowski; Owen M. Williams

doi:10.1117/12.777785

11 April 2008 Resistor array infrared projector nonuniformity correction: search for performance improvement III

Robert A. Joyce, Leszek Świerkowski, Owen M. Williams

Proceedings Volume 6942, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII; 69420N (2008) https://doi.org/10.1117/12.777785
Event: SPIE Defense and Security Symposium, 2008, Orlando, Florida, United States

Abstract

Resistor array infrared projector nonuniformity correction (NUC) is currently limited in fidelity. In the flood technique a fundamental limitation has been the inevitable presence of Moire fringes. In this paper, an advanced NUC procedure is described in which the Moire patterns are successfully subtracted, leading to improved levels of residual nonuniformity. It is shown that, irrespective of the projection technology, the Moire fringes exist at the unit-under-test image plane where they appear in general as sampling noise. Their control through choice of mapping ratio is discussed.

Citation Download Citation

Robert A. Joyce, Leszek Świerkowski, and Owen M. Williams "Resistor array infrared projector nonuniformity correction: search for performance improvement III", Proc. SPIE 6942, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII, 69420N (11 April 2008); https://doi.org/10.1117/12.777785

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