Reflective terahertz en-face tomography

Xinke Wang; Ye Cui; Wenfeng Sun; Yan Zhang

doi:10.1117/12.760136

4 January 2008 Reflective terahertz en-face tomography

Xinke Wang, Ye Cui, Wenfeng Sun, Yan Zhang

Proceedings Volume 6840, Terahertz Photonics; 68400F (2008) https://doi.org/10.1117/12.760136
Event: Photonics Asia 2007, 2007, Beijing, China

Abstract

In this presentation, a system for THz en-face tomography imaging is proposed. The THz radiation reflected by the object is imaged on the ZnTe crystal, and then a CCD is used to detect the two dimensional modulated probe light. By adjusting the delay line, the information about the object can be achieved layer by layer. Expanded terahertz pulses are reflected from the different medium interfaces inside a sample, the amplitudes and time decays of these pulses can be used to determine the thickness of each medium inside the sample. In this way, the structure image of the sample can be reconstructed. The longitudinal resolution of the system is discussed by using the timing information of the reflection terahertz pulses.

Citation Download Citation

Xinke Wang, Ye Cui, Wenfeng Sun, and Yan Zhang "Reflective terahertz en-face tomography", Proc. SPIE 6840, Terahertz Photonics, 68400F (4 January 2008); https://doi.org/10.1117/12.760136

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available