A methodology for measurements of basic parameters in a xDSL system

Edson Brito Jr.; Lamartine V. de Souza; Éder T. Patrício; Agostinho L. S. Castro; Gervásio P. dos S. Cavalcante; João Crisóstomo W. A. Costa; Klas Ericson; Fredrik Lindqvist; Jaume Rius I Riu

doi:10.1117/12.686685

2 October 2006 A methodology for measurements of basic parameters in a xDSL system

Edson Brito Jr., Lamartine V. de Souza, Éder T. Patrício, Agostinho L. S. Castro, Gervásio P. dos S. Cavalcante, João Crisóstomo W. A. Costa, Klas Ericson, Fredrik Lindqvist, Jaume Rius I Riu

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Proceedings Volume 6390, Broadband Access Communication Technologies; 63900M (2006) https://doi.org/10.1117/12.686685
Event: Optics East 2006, 2006, Boston, Massachusetts, United States

Abstract

In order to qualify a subscriber loops for xDSL transmission, basic parameters like transfer function, scattering parameter S11 and characteristic impedance should be known. The aim of this paper is to present a test methodology for measurements of these basic parameters. The characteristic impedance is measured by open/short method and it is compared with the terminated measurement method defined in IEC (International Electrotechnical Commission) 611156-1. Transfer function and scattering parameter S11 of DSL loop are also measured on a real cable. The methodology is based on measurements of a 0.4 mm, 10 pairs, balanced twisted-pair cable of 1400 m of length. In order to improve the analysis of results, we compared the measurements from real cable with results from wireline simulators. The measurement of parameters of xDSL copper loop is done in an infrastructure set up in the LABIT (Technological Innovation in Telecommunications Lab) at UFPA (Federal University of Para), that consist of a wireline simulators, a precision impedance analyzer, and a network analyzer. The results show a difference between the measurements performed with real cables and wireline simulators for transfer function parameter. Characteristic impedance obtained by both methods presented quite similar results.

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Edson Brito Jr., Lamartine V. de Souza, Éder T. Patrício, Agostinho L. S. Castro, Gervásio P. dos S. Cavalcante, João Crisóstomo W. A. Costa, Klas Ericson, Fredrik Lindqvist, and Jaume Rius I Riu "A methodology for measurements of basic parameters in a xDSL system", Proc. SPIE 6390, Broadband Access Communication Technologies, 63900M (2 October 2006); https://doi.org/10.1117/12.686685

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KEYWORDS

Copper

Scattering

Signal attenuation

Network security

Data communications

Device simulation

Resistance

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