Paper
23 February 2005 Irradiation investigations for TESLA and X-FEL experiments at DESY
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Abstract
Electronic components during High Energy Physics experiments are exposed to high level of radiation. Radiation environment causes many problems to electronic devices. This report highlights the major hazards to electronics caused by radiation. Several experiments were done and results are included.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dominik K. Rybka, Arkadiusz Kalicki, Krzysztof T. Pozniak, Ryszard S. Romaniuk, Bhaskar Mukherjee, and Stefan Simrock "Irradiation investigations for TESLA and X-FEL experiments at DESY", Proc. SPIE 5775, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments III, (23 February 2005); https://doi.org/10.1117/12.610592
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Cited by 4 scholarly publications.
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KEYWORDS
Light emitting diodes

Field programmable gate arrays

CCD image sensors

Charge-coupled devices

Electronic components

Logic

Gamma radiation

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