Paper
14 April 2003 Electrical properties of HgMnTe Schottky diodes
Leonid A. Kosyachenko, Sergey E. Ostapov, Andrey V. Markov, Ilary M. Rarenko, Valery M. Sklyarchuk, Ye. F. Sklyarchuk
Author Affiliations +
Proceedings Volume 5065, Sixth International Conference on Material Science and Material Properties for Infrared Optoelectronics; (2003) https://doi.org/10.1117/12.502192
Event: Sixth International Conference on Material Science and Material Properties for Infrared Optoelectronics, 2002, Kiev, Ukraine
Abstract
The electrical properties of Al-Hg1-xMnxTe (x = 0.08 - 0.1) Schottky barriers are investigated. The main parameters of the diode structure and charge transport mechanisms responsible for their characteristics, tunneling and over-barrier passage of carriers, are determined. The features of the diode electrical characteristics caused by the narrow bandgap and big difference between effective masses of carriers are revealed. The results obtained experimentally and theoretically testify of the high detectivity of the diodes studied.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Leonid A. Kosyachenko, Sergey E. Ostapov, Andrey V. Markov, Ilary M. Rarenko, Valery M. Sklyarchuk, and Ye. F. Sklyarchuk "Electrical properties of HgMnTe Schottky diodes", Proc. SPIE 5065, Sixth International Conference on Material Science and Material Properties for Infrared Optoelectronics, (14 April 2003); https://doi.org/10.1117/12.502192
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Diodes

Diffusion

Metals

Aluminum

Crystals

Manganese

Semiconductors

RELATED CONTENT


Back to Top