Characterization of high-OD ultrathin infrared neutral density filters

Simon G. Kaplan; Leonard M. Hanssen; Alan L. Migdall; Glenn Lefever-Button

doi:10.1117/12.326679

8 October 1998 Characterization of high-OD ultrathin infrared neutral density filters

Simon G. Kaplan, Leonard M. Hanssen, Alan L. Migdall, Glenn Lefever-Button

Proceedings Volume 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials; (1998) https://doi.org/10.1117/12.326679
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

We have performed transmittance measurements of metal-film neutral density filters on ultrathin polymer substrates using both Fourier-transform infrared spectrometer and laser-based (3.39 micrometer and 10.6 micrometer) systems. The use of ultrathin substrates, free of etaloning effects over the 2 micrometer to 20 micrometer spectral range, allows the FT-IR and laser measurements to be directly compared. We discuss the evaluation of the uncertainties in the transmittance values in both types of systems.

Citation Download Citation

Simon G. Kaplan, Leonard M. Hanssen, Alan L. Migdall, and Glenn Lefever-Button "Characterization of high-OD ultrathin infrared neutral density filters", Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, (8 October 1998); https://doi.org/10.1117/12.326679

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