Ultrafast measurements of electric fields in semiconductors by optical harmonic generation

Ajay Nahata; Tony F. Heinz; James A. Misewich

doi:10.1117/12.306161

23 April 1998 Ultrafast measurements of electric fields in semiconductors by optical harmonic generation

Ajay Nahata, Tony F. Heinz, James A. Misewich

Proceedings Volume 3277, Ultrafast Phenomena in Semiconductors II; (1998) https://doi.org/10.1117/12.306161
Event: Optoelectronics and High-Power Lasers and Applications, 1998, San Jose, CA, United States

Abstract

We describe the application of an optical second-harmonic sampling technique that allows for the detection of subpicosecond electrical transients.

Citation Download Citation

Ajay Nahata, Tony F. Heinz, and James A. Misewich "Ultrafast measurements of electric fields in semiconductors by optical harmonic generation", Proc. SPIE 3277, Ultrafast Phenomena in Semiconductors II, (23 April 1998); https://doi.org/10.1117/12.306161

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