Paper
20 December 2019 Measurement and characterization of feature parameters for assembly parts based on blue structured light
Author Affiliations +
Proceedings Volume 11209, Eleventh International Conference on Information Optics and Photonics (CIOP 2019); 112091B (2019) https://doi.org/10.1117/12.2543889
Event: Eleventh International Conference on Information Optics and Photonics (CIOP 2019), 2019, Xi'an, China
Abstract
The structured light fields can be spoiled by the noisy environmental light. The defects will occur in reconstructive process due to the enormous change of surface reflectivity, which may ruin the results of the measurement. Thus, a structured light measuring system was proposed in this paper, taking the advantages of blue structured light, to reduce the disturbance of noise. A set of geometric feature parameters are proposed for characterizing the assembling errors of assembly parts, and the corresponding computation algorithms are presented based on the measured scattered points data. The proposed method can effectively reduce the influence of reflective deficiency. Experimental studies have been undertaken by measuring an assembly parts made by aluminum alloy, the measured results are also compared with those by a robotic coordinate measuring machine from Hexagon. The results show that the proposed measurement method and the developed system provides an efficient non-contact way for analyzing the feature parameters for assembly parts with high reflective surface in a high precision.
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Sijia Liu, Guangxi Dong, Lingbao Kong, and Lizhe Qi "Measurement and characterization of feature parameters for assembly parts based on blue structured light", Proc. SPIE 11209, Eleventh International Conference on Information Optics and Photonics (CIOP 2019), 112091B (20 December 2019); https://doi.org/10.1117/12.2543889
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KEYWORDS
Structured light

3D metrology

Reflectivity

Clouds

3D modeling

Metals

Optical testing

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