Amorphous hydrogenated silicon (a-Si:H) is a very interesting and perspective semiconductor applied in solar cells, optical image sources, memory cells, etc. But the problem of metal- amorphous hydrogenated silicon contact is not solved at present. It has been noted that application of the crystalline barrier theory is not correct in this case. This is connected with the high density of states in the midgap, which is not observed in crystalline silicon. Evidently the high density of states influences to a large extent the metal/a-Si:H barrier parameters and its formation mechanism. In this paper, some theoretical calculations of voltaic dependence of the barrier low-frequency capacitance are presented with the results of barrier height measurement.
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