Evaluation of line-type thin-film transistor liquid-crystal display defects based on human visual perception

No-Kap Park; Suk In Yoo

doi:10.1117/1.2957879

1 July 2008 Evaluation of line-type thin-film transistor liquid-crystal display defects based on human visual perception

No-Kap Park, Suk In Yoo

Author Affiliations +

Journal of Electronic Imaging, Vol. 17, Issue 3, 031107 (July 2008). https://doi.org/10.1117/1.2957879

Abstract

We propose an evaluation system that assigns each line-type thin-film transistor liquid-crystal display defect a corresponding level that objectively agrees with human visual perception. By “objective,” we mean that the evaluation corresponds, on average, with the assessment of a group of inspectors. The basic idea is to use the human visual perception to evaluate defects. Crucial features of defects are selected to represent the human visual perception for the line-type defect. In the process, we define the “just-noticeable difference surface” (JND) and evaluate the level of defect as the distance from a feature point consisting of selected features of the JND.

©(2008) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

No-Kap Park and Suk In Yoo "Evaluation of line-type thin-film transistor liquid-crystal display defects based on human visual perception," Journal of Electronic Imaging 17(3), 031107 (1 July 2008). https://doi.org/10.1117/1.2957879

Published: 1 July 2008

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